Detailed discussions for Sector 30 instrumentation can be found in the following publications:
- "Spectroscopy with meV energy resolution" H. Sinn, J. Phys. Condens. Matter 13 (34), 7525-7537 (2001)
- "Development of a two-dimensional focusing faceted x-ray analyzer" H. Sinn, N. Moldocan, A.H. Said, E.E. Alp, Proc. SPIE, 4783, SPIE (2002), 123 - 130.
- "A cryogenically stabilized meV-monochromator for hard X-rays" T.S. Toellner, A. Alatas, A. Said, D. Shu, W. Sturhahn, J. Zhao, J. Synchrotron Rad. 13 (2), 211-215 (2006).
- "Six-reflection meV-monochromator for synchrotron radiation" T.S. Toellner, A. Alatas, A.H. Said, J. Synchrotron Rad. 18 (4), 605-611 (2011).
- "New developments in fabrication of high-energy-resolution analyzers for inelastic X-ray spectroscopy" Ayman H. Said, Harald Sinn, Ralu Divan,J. Synchrotron Rad. 18 (3), 492-496 (2011)
- "High-energy-resolution inelastic X-ray scattering spectrometer at beamline 30-ID of the Advanced Photon Source" Ayman H. Said, Harald Sinn, Thomas S. Toellner, Ercan E. Alp, Thomas Gog, Bogdan M. Leu, Sunil Bean, Ahmet Alatas, J. Synchrotron Rad. 27 (3), 827-835 (2020).
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