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A | B | C | D | E | F | G | H | I | J | K | L | M | N | O | P | Q | R | S | T | U | V | W | X | Y | Z
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- ACIS Accelerator Access Control & Interlock System
- ADD Associate Division Director
- AES APS Engineering Support Division (ANL/APS)
- AES area emergency supervisor
- AFM atomic force microscope
- AIC Argonne Information Center
- AIM Argonne Information Management System
- ALARA as low as reasonably achievable
- ALD Associate Laboratory Director
- ALFF Argonne Linear FEL
- AMOS Argonne Materials Ordering System
- ANL Argonne National Laboratory
- ANSI American National Standards Institute
- APD avalanche photodiode
- APS Advanced Photon Source
- APSUO Advanced Photon Source Users Organization
- APS RES Advanced Photon Source research initiative
- ARPES angle-resolved photoemission spectroscopy
- ASD Accelerator Systems Division (ANL/APS)
- ATI Argonne Theory Institute (ANL)
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- BAC Beam Time Allocation Committee
- BCM bent-crystal monochromator
- BCTF Beamline Component Test Facility
- BRC Beamline Review Committee
- BCRRT Beamline Commissioning Readiness Review Team
- BLEPS beamline equipment protection system
- BM bending magnet
- BPM beam position monitor
- BTR beam time request
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- CAT Collaborative Access Team
- CBT computer-based training
- CCD charge coupled device
- CCST Coordination Council for Science and Technology
- CDT Collaborative Development Team
- CFM confocal fluorescence microscopy
- CLO central laboratory/office (building)
- CM configuration management
- CMS chemical management system
- COATS corrective action tracking system
- CPU circularly polarized undulator
- CST coherent synchrotron radiation
- CT compact tension
- CVD chemical vapor deposition
- CXDI coherent x-ray diffractive imaging
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- DBPLD digitizing beam position limit detectors
- DCC Document Control Center
- DCM double-crystal monochromator
- DD Deputy Director
- DEC Digital Equipment Corporation
- DIW deionized water
- DMM double-multilayer monochromator
- DX Design Exchange
- DXRL deep x-ray lithography
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- EAA experiment assembly area
- EEF End of Experiment Form
- EMW elliptical multipole wiggler
- EPICS Experimental Physics and Industrial Control System
- EPS equipment protection system
- EQO ESH/QA Oversight Group
- ESAF Experiment Safety Approval Form
- ES&H environment, safety, and health
- ESRB Experimental Safety Review Board
- ETS equipment tracking system
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- FDR final design report
- FE front end (beamline)
- FEA finite element analysis
- FEEPS front-end equipment protection system
- FEL free-electron laser
- FOE first optics enclosure
- FTIR Fourier transform infrared spectroscopy
- FV fast valve
- FWHM full width half maximum
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- GERT General Employee Radiation Training
- GFCI ground fault circuit interrupter
- GISAXS grazing-incidence small-angle x-ray scattering
- GU general user
- GUP General User Program
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- HazMats hazardous materials
- HDF hierarchical data format
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- ICMS integrated content management system
- ID insertion device
- IOC input/output controller
- IR infra-red
- ISI interlock systems and instrumentation
- ISM integrated safety management
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- JHQ Job Hazard Questionnaire
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- LDAE laser doppler angular encoder
- LDDM laser doppler displacement meter
- LDRD Laboratory Directed Research & Development
- LN2 liquid nitrogen
- LNDS liquid nitrogen distribution system
- LOI Letter of Intent
- LOM laboratory/office module
- LOTO lockout/tagout
- LTP long trace profiler
- LSO Laser Safety Officer
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- MCD magnetic circular dichroism
- MCS magnetic compton scattering
- MCR Main Control Room
- MEMS micro-electromechanical systems
- MOF Metal-organic framework
- MOU memorandum of understanding
- MPS machine protection system
- MSDS material safety data sheet
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- nbbpm narrow band beam position monitor
- NFPA National Fire Protection Association
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- OJT on-the-job training
- ORPS Occurrence Reporting and Processing System
- OUI operator/user interface
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- PD position description
- PDR preliminary design report
- PEEM photoemission electron microscopy
- PHOENIX phonon excitation by nuclear inelastic absorption of x-rays
- PI principal investigator
- PIN personal identification number
- PLC programmable logic controller
- PMMA Polymethylmethacrylate
- PPE personal protective equipment
- PRP (General User) Proposal Review Panels
- PS1 photon shutter 1
- PS2 photon shutter 2
- PSD power spectral density function
- PSS personnel safety system
- PUC Partner User Council
- PUP Partner User Proposal
- PZT piezoelectric transducer
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- QA quality assurance
- QAP quality assurance plan
- QAPP quality assurance program plan
- QAR quality assurance representative
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- RBC red blood cells
- R&D research & development
- RSSC Radioactive Sample Safety Committee
- RE rare earth
- rf radio frequency
- RGA residual gas analyzer
- RMD repair, modify, and develop system
- rms root mean square
- RSXS resonant soft x-ray scattering
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- SAC Scientific Advisory Committee
- SAD safety assessment document
- SASE self-amplified spontaneous emission
- SGM spherical grating monochromator
- SI strategic initiative
- SMART Safety Management Records Tool
- SOC Safety Overview Committee
- SRI synchrotron radiation instrumentation
- SRO service request order
- SSC structures, systems, and components
- SXM scanning x-ray microscope
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- TEY total electron yield
- TIS Technical Information Services
- TLD thermoluminescent dosimeter
- TMS training management system
- TTL transitor-transitor logic
- TTU topo test unit
- TWG InterCAT Technical Workgroup
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- UA undulator A
- UHV ultrahigh vacuum
- URL uniform resource locator
- UTIG User Technical Interface Group
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- VDOS vibrational density of states
- VUV vacuum ultraviolet
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- XAFS x-ray absorption fine structure
- XANES x-ray near-edge absorption spectroscopy
- XAS x-ray absorption spectroscopy
- XBPM x-ray beam position monitor
- XELM x-ray excited luminescence microscopy
- XFCS x-ray fluorescence correlation spectroscopy
- XFT x-ray fluorescence tomography
- XFM x-ray fluorescence microscopy
- XIFS x-ray intensity fluctuation spectroscopy
- XMCD x-ray magnetic circular dichroism
- XMD x-ray microdiffraction
- XMDC x-ray magnetic circular dichroism
- XMSAS x-ray microbeam small-angle scattering
- XPCS x-ray photoelectron correlation spectroscopy
- XPS x-ray polarization and spectroscopy
- XRD x-ray diffraction
- XRF x-ray fluorescence
- XRIM x-ray reflection interface microscopy
- XSD X-ray Science Division (ANL/APS)
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